| Monday, May 19
|
| 8:00 - 9:40 | Opening Ceremonies
|
| Introduction
| Conference Chairman, Wojtek Bock
|
| Welcome
| I&M Society President, J. Barry Oakes
|
| Conference Program
| Technical Program Co-Chairmen: Emile Petriu and Peter Filipski
|
| Keynote address
| Canadian Microelectronics Corporation President, A. H. Marsh
|
| 9:40 - 10:20 |
Break: coffee, tea and refreshments
|
| 10:20 - 12:00 |
Morning Sessions
|
| M11
| Imaging Systems |
| M12
| Microwave Measurement
|
| M13
| Predictive Signal Processing
|
| M14
| Integration of the Measurement Systems
|
| 12:00 - 13:30 |
Lunch
|
| Afternoon Sessions
|
| 13:30 - 15:10 |
M21 | Image Processing
|
| M22
| Electromagnetic Measurements
|
| M23
| Signal Processing
|
| M24
| Industrial Measurements
|
| 15:10 - 15:50 |
Break: coffee, tea and refreshments
|
|
Poster Sessions
|
| 13:30-17:30 | MP1-1
| Soft Computing Techniques
|
| MP1-2
| Optical/Pressure/Flow/Temperature Measurements
|
| MP1-3
| Power Measurements
|
| MP1-4
| Electronic Instrumentation
|
| 21-5
| Precision Measurements
|
| 18:00 - 20:00 |
MP21 | Signal/Image Processing
|
| MP22
| Microwave/Electromagnetic Measurements
|
| MP23
| Medical Instrumentation
|
| MP24
| System Identification
|
| Tuesday, May 20
|
|
Morning Sessions
|
| 08:00-09:40 | T11
| Sensors for Robotics
|
| T12
| FiberOptic BraggGrating Sensors
|
| T13
| AnalogToDigital Converters
|
| T14
| Microwave Semiconductor and Dielectric Measurements
|
| 9:40 - 10:20 |
Break: Coffee, Tea and Refreshments
|
| 10:20 - 12:00 |
T21 | Virtual Instrumentation Systems
|
| T22
| Fiber Optic Sensors in Engineering Mechanics
|
| T23
| Precision Measurements
|
| T24
| System Identification
|
| 12:00 - 13:30 |
Lunch |
| Afternoon Sessions
|
| 15:50 - 17:30 |
T31 | Fuzzy Systems for Instrumentaton and Measurement
|
| T32
| Pressure Measurements and Standards
|
| T33
| Instrumentation and Sensors for Control
|
| T34
| Optical Measurements
|
|
Poster Sessions
|
| 13:30 - 17:30 |
TP-1 | Sensors
|
| TP-1A
| Sensors for Robotics
|
| TP-2
| Data Acquisition
|
| TP-3
| Industrial/Environmental Measurements
|
| Wednesday, May 21
|
| Morning Sessions
|
| 08:00 - 09:40 |
W11 | Neural Networks for Instrumentation and Measurement
|
| W12
| Analysis of the Time Domain Measurements.
|
| W13
| Integrated Sensors
|
| W14
| Data Acquisition
|
| 9:40 - 10:20 |
Break: coffee, tea and refreshments
|
| 10:20 - 12:00 |
W21 | Soft Computing Techniques for Instrumentation and Measurement
|
| W22
| Environmental Measurements
|
| W23
| Automotive Sensors
|
| W24
| Electronic Instrumentation
|
| |
|
Afternoon Sessions
|
| 13:30 - 15:10 |
W31 | Instrumentation and Measurement Education
|
| W32
| Medical Instrumentation
|
| W33
| Flow and Temperature Sensors
|
| W34
| Power Measurements
|
| 15:10 - 15:50 |
Break: coffee, tea and refreshments
|
| 15:50 - 17:30 |
W41 | Computer Controlled Measurement Environment for Education
|
| W42
| Testability of Integrated Circuit Design
|
| W43
| Sensors |
| W44
| Electronic Instrumentation I
|
| | |